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Hot-carrier degradation studies at silicon-silicon dioxide interface in short channel mosfets

Resource type
Thesis
Thesis type
(Thesis) M.A.Sc.
Date created
1991
Authors/Contributors
Author: Li, Xiao Ming
Copyright statement
Copyright is held by the author.
Permissions
The author has not granted permission for the file to be printed nor for the text to be copied and pasted. If you would like a printable copy of this thesis, please contact summit-permissions@sfu.ca.
Scholarly level
Graduate student (Masters)
Supervisor or Senior Supervisor
Thesis advisor: Deen, M. J.
Language
English
Member of collection
Engineering Science Theses
Download file Size
b1444267x.pdf 1.07 MB

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