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A study of isoelectronic defects in Si under uniaxial stress and magnetic fields

Resource type
Thesis type
(Thesis) Ph.D.
Date created
1986
Authors/Contributors
Author (aut): Watkins, Simon P
Document
Copyright statement
Copyright is held by the author.
Permissions
The author has not granted permission for the file to be printed nor for the text to be copied and pasted. If you would like a printable copy of this thesis, please contact summit-permissions@sfu.ca.
Scholarly level
Language
English
Member of collection
Download file Size
b16648687.pdf 2.58 MB

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