Stimulated secondary emission from single photon avalanche diodes

An experimental setup was developed for analyzing the secondary photons produced by the Geiger mode avalanches utilized by Silicon Photomultipliers (SiPMs). The spectrum of these secondary photons previously has never been measured at the normal operating ranges of SiPMs. While secondary photons have an impact on the performance of SiPM themselves, they can also escape their source SiPM and trigger additional signals in other SiPMs. For this reason, secondary emission is of great importance of large photosensitive detectors. This work characterizes two SiPM devices of interest for the next Enriched Xenon Observatory (nEXO) double beta decay experiment: the FBK-VUV-HD3 and HPK-VUV4. The measurements reported in this work are intended to be used in a Monte-Carlo simulation of a smaller scale liquid xenon detector system called LoLX for understanding the impact of secondary emission in a larger detector system such as nEXO.