THz measurements of semiconductor nanostructures

Resource type
Thesis type
(Thesis) M.Sc.
Date created
2014-09-15
Authors/Contributors
Abstract
This thesis describes measurements made using terahertz (THz) spectroscopy applied to semiconductor nanostructures. Our samples take the form of either thin continuous films or nanowire fields. We fit the Drude model to our results on thin continuous films to obtain their carrier density and mobility, and compare these to DC transport measurements. We compare our measurements of nanowire fields to expectations based on the Bruggeman effective medium theory.
Document
Identifier
etd8658
Copyright statement
Copyright is held by the author.
Permissions
The author granted permission for the file to be printed and for the text to be copied and pasted.
Scholarly level
Supervisor or Senior Supervisor
Thesis advisor: Dodge, Steven
Member of collection
Attachment Size
etd8658_RAbraham.pdf 2.31 MB