THz measurements of semiconductor nanostructures

This thesis describes measurements made using terahertz (THz) spectroscopy applied to semiconductor nanostructures. Our samples take the form of either thin continuous films or nanowire fields. We fit the Drude model to our results on thin continuous films to obtain their carrier density and mobility, and compare these to DC transport measurements. We compare our measurements of nanowire fields to expectations based on the Bruggeman effective medium theory.