Electrical Conduction and Structure of Copper Atomic Junctions in the Presence of Water Molecules

Peer reviewed: 
Yes, item is peer reviewed.
Scholarly level: 
Faculty/Staff
Final version published as: 

Li, Y. et al. Phys. Chem. Chem. Phys., 2015,17, 32436-32442. DOI: 10.1039/C5CP05227K

Keywords: 
Atomic junction
Cu
H2O
Copper
Water
Structure
Electrical conduction
Abstract: 

We have investigated Cu atomic contacts in the presence of H2O both experimentally and theoretically. The conductance measurements showed the formation of H2O/Cu junctions with a fixed conductance value of around 0.1 G0 (G0 = 2e2/h). These structures were found to be stable and could be stretched over 0.5 nm, indicating the formation of an atomic or molecular chain. In agreement with the experimental findings, theoretical calculations revealed that the conductance of H2O/Cu junctions decreases in stages as the junction is stretched, with the formation of a H2O/Cu atomic chain with a conductance of ca. 0.1 G0 prior to junction rupture. Conversely, in the absence of H2O, the conductance of the Cu junction remains close to 1 G0prior to the junction rupture and abrupt conductance drop.

Language: 
English
Document type: 
Article
Rights: 
Rights remain with the authors.
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Sponsor(s): 
MEXT
Murata Science Foundation
Asahi Glass Foundation
Natural Sciences and Engineering Research Council of Canada (NSERC)
Canadian Institute for Advanced Research (CIFAR)
WestGrid
Compute Canada
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