Resource type
Thesis type
(Thesis) M.A.Sc.
Date created
2010-06-03
Authors/Contributors
Author: Jarollahi, Hooman
Abstract
The purpose of this thesis is to introduce a new low-power, reliable and high-performance five-transistor (5T) SRAM in 65nm CMOS technology, which can be used for cache memory in processors and low-power portable devices. An area reduction of ~13% compared to a conventional 6T cell is possible. A biasing ground line is charged by channel leakage current from memory cells in standby, and is used to pre-charge a single bit-line and bias the negative supply voltage of each memory cell to suppress standby leakage power. A major standby power reduction is gained compared to conventional 5T and 6T designs, and up to ~30% compared to previous low-power 6T designs. Read, write, and standby performance and reliability issues are discussed and compared with conventional and low-power 6T SRAM designs.
Document
Identifier
etd6047
Copyright statement
Copyright is held by the author.
Scholarly level
Supervisor or Senior Supervisor
Thesis advisor: Hobson, Richard F.
Thesis advisor: Syrzycki, Marek
Member of collection
Download file | Size |
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etd6047_HJarollahi.pdf | 3.98 MB |